SSRNOther
DualChannel Wafer Defect Segmentation Algorithm
The paper suggests a density-adaptive threshold data augmentation algorithm to enhance defect pattern recognition in semiconductor wafer maps, based on a detailed analysis of defect distribution characteristics.
Featured in No. 81 on 8 Jan 2025 · 1 day after release
- Released
- 7 Jan 2025
- First featured
- No. 81 · 8 Jan 2025
- Published in
- Not yet, as far as Semantic Scholar knows
- Shares when featured
- 3
- Identifier
- SSRN 5084918
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